The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2018
Filed:
Jun. 22, 2015
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventor:
Junichi Wakabayashi, Matsumoto, JP;
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1335 (2006.01); G02B 3/00 (2006.01); G02B 19/00 (2006.01); G02F 1/1333 (2006.01);
U.S. Cl.
CPC ...
G02F 1/133526 (2013.01); G02B 3/0012 (2013.01); G02B 3/0056 (2013.01); G02B 19/0014 (2013.01); G02F 2001/133302 (2013.01);
Abstract
A microlens array substrate includes a substrate having a surface in which a concave portion is provided, a lens layer that is provided so as to fill the concave portion, and an optical path length adjustment layer that is provided so as to cover the lens layer. A flat portion is disposed in a central portion of the concave portion. A refractive index of the lens layer is higher than a refractive index of the substrate, and a refractive index of the optical path length adjustment layer is higher than a refractive index of the substrate and is equal to or lower than a refractive index of the lens layer.