The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

Nov. 25, 2016
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Hiroaki Kobayashi, Saitama, JP;

Takeshi Kamiya, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 9/62 (2006.01); G02B 13/00 (2006.01); G02B 13/04 (2006.01); G02B 7/02 (2006.01);
U.S. Cl.
CPC ...
G02B 13/0045 (2013.01); G02B 13/04 (2013.01); G02B 7/028 (2013.01);
Abstract

Provided are an imaging lens that has a small amount of focus shift caused by temperature fluctuation and an imaging apparatus that has this imaging lens. The imaging lens consists of, in order from an object side: a first lens that is convex toward the object side and has a negative refractive power; a second lens that has a negative refractive power; a third lens that has a positive refractive power; a fourth lens that has a positive refractive power; a fifth lens that has a positive refractive power; and a sixth lens that has a negative refractive power. The imaging lens satisfies the following conditional expressions (1) to (4).−0.89<12<−0.53   (1)−0.19<1<−0.1   (2)−0.70<2<−0.45   (3)2.4<1/2<5.7   (4)


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