The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

Apr. 08, 2016
Applicant:

Xia Llc, Hayward, CA (US);

Inventors:

William K. Warburton, Oakland, CA (US);

Wolfgang G. Hennig, Fremont, CA (US);

Assignee:

XIA LLC, Hayward, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/17 (2006.01); G01T 1/178 (2006.01); G01T 1/20 (2006.01); G01T 1/208 (2006.01);
U.S. Cl.
CPC ...
G01T 1/178 (2013.01); G01T 1/208 (2013.01); G01T 1/2018 (2013.01);
Abstract

A method and apparatus for measuring the concentrations of radioxenon isotopes in a gaseous sample wherein the sample cell is surrounded by N sub-detectors that are sensitive to both electrons and to photons from radioxenon decays. Signal processing electronics are provided that can detect events within the sub-detectors, measure their energies, determine whether they arise from electrons or photons, and detect coincidences between events within the same or different sub-detectors. The energies of detected two or three event coincidences are recorded as points in associated two or three-dimensional histograms. Counts within regions of interest in the histograms are then used to compute estimates of the radioxenon isotope concentrations. The method achieves lower backgrounds and lower minimum detectable concentrations by using smaller detector crystals, eliminating interference between double and triple coincidence decay branches, and segregating double coincidences within the same sub-detector from those occurring between different sub-detectors.


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