The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

Dec. 29, 2014
Applicant:

Avery Dennison Retail Information Services, Llc, Westborough, MA (US);

Inventors:

Adrian N. Farr, Essex, GB;

Ian James Forster, Essex, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/26 (2014.01); G01R 27/02 (2006.01); G06K 19/08 (2006.01); G06K 7/00 (2006.01); G08B 13/14 (2006.01); G08B 21/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2822 (2013.01);
Abstract

Systems and methods provided for testing remote frequency identification (RFID) straps on a web. Testing system includes a test head having a pair of contact pins configured to be moved toward the web (or configured to make contact with web moved towards them) and into contact with the web or RFID strap. Conveyor continuously moves the web to move individual RFID straps into and out of alignment with the test head. Controller causes the contact pins to move toward the web at a frequency that's greater than the frequency at which the conveyor moves consecutive RFID straps into alignment with the test head. Alternatively or additionally, the test head may have a mount formed of a compliant material that allows at least a portion of the test head to deflect while the contact pins are in contact with a continuously moving RFID strap, thereby maintaining contact between contact pins and strap.


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