The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

Aug. 17, 2016
Applicant:

Agilome, Inc., La Jolla, CA (US);

Inventor:

Paul Hoffman, La Jolla, CA (US);

Assignee:

Agilome, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); G01N 27/414 (2006.01); H01L 29/16 (2006.01); H01L 29/417 (2006.01); G01N 27/327 (2006.01); H01L 29/786 (2006.01);
U.S. Cl.
CPC ...
G01N 27/4148 (2013.01); G01N 27/3276 (2013.01); H01L 29/1606 (2013.01); H01L 29/4175 (2013.01); H01L 29/41733 (2013.01); H01L 29/78603 (2013.01); H01L 29/78684 (2013.01);
Abstract

This invention concerns chemically-sensitive field effect transistors (FETs) are preferably fabricated using semiconductor fabrication methods on a semiconductor wafer, and in preferred embodiments, on top of an integrated circuit structure made using semiconductor fabrication methods. The instant chemically-sensitive FETs typically comprise a conductive source, a conductive drain, and a channel composed of a one-dimensional (1D) or two-dimensional (2D) transistor material, which channel extends from the source to the drain and is fabricated using semiconductor fabrication techniques on top of a wafer. Such chemically-sensitive FETs, preferably configured in independently addressable arrays, may be employed to detect a presence and/or concentration changes of various analyte types in chemical and/or biological samples, including nucleic acid hybridization and/or sequencing reactions.


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