The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2018
Filed:
Dec. 23, 2014
Nuctech Company Limited, Beijing, CN;
Tsinghua University, Beijing, CN;
Huaping Tang, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Chuanxiang Tang, Beijing, CN;
Huaibi Chen, Beijing, CN;
Yuanjing Li, Beijing, CN;
Ziran Zhao, Beijing, CN;
Yaohong Liu, Beijing, CN;
Shangmin Sun, Beijing, CN;
Xinshui Yan, Beijing, CN;
Zhanfeng Qin, Beijing, CN;
NUCTECH COMPANY LIMITED, Beijing, CN;
TSINGHUA UNIVERSITY, Beijing, CN;
Abstract
The X-ray fluoroscopic imaging system of the present invention comprises: an inspection passage; an electron accelerator; a shielding collimator apparatus comprising a shielding structure, and a first collimator for extracting a low energy planar sector X-ray beam and a second collimator for extracting a high energy planar sector X-ray beam which are disposed within the shielding structure; a low energy detector array for receiving the X-ray beam from the first collimator; and a high energy detector array for receiving the X-ray beam from the second collimator. The first collimator, the low energy detector array and the target point bombarded by the electron beam are located in a first plane; and the second collimator, the high energy detector array and the target point bombarded by the electron beam are located in a second plane.