The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2018
Filed:
Aug. 27, 2014
Ge-hitachi Nuclear Energy Americas Llc, Wilmington, NC (US);
Robert W. Viren, Wilmington, NC (US);
GE-HITACHI NUCLEAR ENERGY AMERICAS LLC, Wilmington, NC (US);
Abstract
Inspection devices nondestructively sense component shape and integrity such as through ultrasonic sensors. Inspection devices include a positional determinator to give orientation of devices relative to the tested object. True distances and relative boundaries of the object are determined with testing and orientation data regardless of rigid or known inspection device position. Inspection data can be corrected for refraction knowing distances and object boundaries. Inspection devices can include additional inspection components like cameras and lighting to match visual inspection with nondestructive testing data spatially and temporally. Inspection devices can be used with self- or manual-propulsion in a working environment with the inspection object. Inspection devices use an operator or computer processor, local or remotely-connected power sources, and communications structures to power and operate the devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile