The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2018
Filed:
Jun. 27, 2017
Manta Instruments, Inc., San Diego, CA (US);
Jan J. Tatarkiewicz, San Diego, CA (US);
Manta Instruments, Inc., San Diego, CA (US);
Abstract
A method for calibrating a dark field microcopy setup is disclosed. The method includes preparing a plurality of particle samples, each with a known concentration and particle size, the plurality having more than one particle size and, optionally, more than one refractive index and more than one diluent. For each sample in the plurality, the sample is measured in the setup and the scattered light intensity and number of particles is measured. From this data, a relationship between the scattered light intensity, particle size and calibrated investigated volume can be determined. The calibrated investigated volume is used to obtain the proper particle size distribution in a given diluent.