The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

Oct. 14, 2014
Applicant:

Fukuda Co., Ltd., Tokyo, JP;

Inventors:

Takaaki Watanabe, Tokyo, JP;

Tsutomu Hara, Tokyo, JP;

Naohiko Maruno, Tokyo, JP;

Assignee:

Fukuda Co., Ltd., Tokyo, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 3/20 (2006.01); G01M 3/22 (2006.01); G01M 3/32 (2006.01);
U.S. Cl.
CPC ...
G01M 3/20 (2013.01); G01M 3/202 (2013.01); G01M 3/226 (2013.01); G01M 3/229 (2013.01); G01M 3/3272 (2013.01);
Abstract

In leak testing by an accumulation method, it is possible to reliably detect accumulated inspection gas, and the reliability of leak testing is enhanced by reduction in background or impurity gas. At least an openable/closeable partof a capsuleis housed inside a chamberof a leak testing apparatus. A test workpieceis housed in the capsule. Gas inside the chamberis evacuated by a vacuum pump. A detectordetects inspection gas contained in this gas. The capsuleis continuously sealed for an accumulation time Ta, the capsuleis thereafter opened, and a leak is evaluated on the basis of detection information after the opening by the detector


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