The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

Feb. 28, 2017
Applicants:

Emisense Technologies, Llc, Ladera Ranch, CA (US);

Lawrence Livermore National Security, Llc, Livermore, CA (US);

Inventors:

Leta Yar-Li Woo, Oakland, CA (US);

Robert Scott Glass, Livermore, CA (US);

Joseph Jay Fitzpatrick, Glendale, CA (US);

Gangqiang Wang, Salt Lake City, UT (US);

Brett Tamatea Henderson, Salt Lake City, UT (US);

Anthoniraj Lourdhusamy, West Jordan, UT (US);

James John Steppan, Park City, UT (US);

Klaus Karl Allmendinger, San Juan Capistrano, CA (US);

Assignees:

Lawrence Livermore National Security, LLC, Livermore, CA (US);

EmiSense Technologies, LLC, Ladera Ranch, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 13/02 (2006.01); G01N 27/407 (2006.01); G01N 27/406 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01K 13/02 (2013.01); G01N 27/4065 (2013.01); G01N 27/4071 (2013.01); G01N 27/4074 (2013.01); G01N 27/4075 (2013.01); G01N 33/0037 (2013.01); G01K 2013/024 (2013.01); G01K 2205/04 (2013.01);
Abstract

A method for temperature analysis of a gas stream. The method includes identifying a temperature parameter of an affected waveform signal. The method also includes calculating a change in the temperature parameter by comparing the affected waveform signal with an original waveform signal. The method also includes generating a value from the calculated change which corresponds to the temperature of the gas stream.


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