The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2018
Filed:
Dec. 28, 2015
Applicants:
Daichi Yamaguchi, Kanagawa, JP;
Shuusuke Someno, Kanagawa, JP;
Inventors:
Daichi Yamaguchi, Kanagawa, JP;
Shuusuke Someno, Kanagawa, JP;
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01H 17/00 (2006.01); G01Q 20/02 (2010.01);
U.S. Cl.
CPC ...
G01H 17/00 (2013.01); G01Q 20/02 (2013.01);
Abstract
A minute object characteristics measuring apparatus is provided. The minute object characteristics measuring apparatus includes a holder, a cantilever, a measuring device, and a driver. The holder holds a minute object. The cantilever faces the minute object held by the holder. The measuring device measures a displacement of the cantilever. The driver drives one of the holder holding the minute object and the cantilever in a direction that the minute object held by the holder and the cantilever are brought close to or drawn away from each other.