The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2018
Filed:
Oct. 24, 2014
Applicant:
Hexagon Metrology, Inc., North Kingstown, RI (US);
Inventors:
Jonathan J. O'Hare, Warwick, RI (US);
Stephen Darrouzet, West Warwick, RI (US);
Assignee:
Hexagon Metrology, Inc., North Kingstown, RI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01B 11/00 (2006.01); G01N 23/04 (2006.01); G06K 9/52 (2006.01); G06T 5/00 (2006.01); H05G 1/10 (2006.01); G01B 15/04 (2006.01);
U.S. Cl.
CPC ...
G01B 11/005 (2013.01); G01B 15/045 (2013.01); G01N 23/046 (2013.01); G06K 9/52 (2013.01); G06T 5/001 (2013.01); H05G 1/10 (2013.01); G06T 2207/10116 (2013.01);
Abstract
A method of measuring an object having associated geometric data and material data receives the geometric data and material data relating to the object, and controls an x-ray device to scan the object. The x-ray device operates in accordance with a plurality of operating parameters. The method then varies at least one of the operating parameters during the scan as a function of one or both the geometric data and the material data.