The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

Sep. 24, 2014
Applicant:

John M Hoffer, Jr., Columbia, MD (US);

Inventor:

John M Hoffer, Jr., Columbia, MD (US);

Assignee:

TVS Holdings, LLC, Columbia, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02083 (2013.01); G01B 9/02075 (2013.01); G01B 11/14 (2013.01);
Abstract

A multi-mode frequency sweeping interferometer has a single measurement light producing device configured to produce a coherent light source consisting of a single light beam. The single measurement light producing device transitions the single light beam between a fixed light beam and a scanning wavelength light beam. A primary beam splitter produces a first reference beam and a first measurement beam from said single light beam. The first reference beam is configured to travel a fixed path length to a primary reference reflector and the first measurement beam is configured to travel to and from a moveable reflective target over an unknown path length. A first interferometer is created by interfering the first reference beam with the first measurement beam and one or more optoelectronic devices may be configured to determine a measured distance to the movable reflective target.


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