The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2018
Filed:
Oct. 01, 2016
Bertec Corporation, Columbus, OH (US);
Necip Berme, Worthington, OH (US);
Benjamin Robert Hoffman, Columbus, OH (US);
Sasan Ghassab, Columbus, OH (US);
Bertec Corporation, Columbus, OH (US);
Abstract
A force measurement system includes a plurality of force measurement assemblies arranged in a loop configuration, the plurality of force measurement assemblies configured to be displaced around a continuous path of movement such that a particular one of the plurality of force measurement assemblies that is disposed underneath a subject varies over time. Each of the plurality of force measurement assemblies includes a top surface for receiving at least one portion of the body of the subject; and at least one force transducer, the at least one force transducer configured to sense one or more measured quantities and output one or more signals that are representative of forces and/or moments being applied to the top surface of the force measurement assembly by the subject. The force measurement system may additionally comprise a data processing device operatively coupled to each of the force transducers of each of the force measurement assemblies.