The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2017
Filed:
Nov. 17, 2014
Applicants:
Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;
Centre National DE LA Recherche Scientifique, Paris, FR;
Inventors:
Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 13/00 (2006.01); G06K 9/20 (2006.01); H04N 9/083 (2006.01); H04N 9/76 (2006.01); H04N 13/02 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0022 (2013.01); G06K 9/00201 (2013.01); G06K 9/209 (2013.01); G06K 9/2018 (2013.01); H04N 9/083 (2013.01); H04N 9/76 (2013.01); H04N 13/0257 (2013.01); H04N 2013/0081 (2013.01); H04N 2209/045 (2013.01);
Abstract
A method for estimating the image depth map of a scene, includes the following steps: providing (E) an image, the focus of which depends on the depth and wavelength of the considered object points of the scene, using a longitudinal chromatic optical system; determining (E) a set of spectral images from the image provided by the longitudinal chromatic optical system; deconvoluting (E) the spectral images to provide estimated spectral images with field depth extension; and analyzing (E) a cost criterion depending on the estimated spectral images with field depth extension to provide an estimated depth map.