The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2017

Filed:

May. 31, 2016
Applicant:

Semiconductor Manufacturing International (Shanghai) Corporation, Shanghai, CN;

Inventors:

Jiquan Liu, Shanghai, CN;

Ming Zhou, Shanghai, CN;

Charles Wang, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/321 (2006.01); H01L 21/768 (2006.01); H01L 23/532 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 23/53238 (2013.01); H01L 21/02074 (2013.01); H01L 21/76849 (2013.01); H01L 21/76867 (2013.01); H01L 21/76883 (2013.01); H01L 23/5329 (2013.01);
Abstract

A method for fabricating a semiconductor structure includes providing a dielectric layer on a semiconductor substrate, forming an opening in the dielectric layer to expose a portion of the surface of the semiconductor substrate, forming a metal layer to fill up the opening, and removing the portion of the metal layer formed above the top surface of the dielectric layer by polishing. A metal oxide layer is formed on the surface of the metal layer after polishing. The method further includes removing the metal oxide layer from the top surface of the metal layer, forming a metal barrier layer on the top surface of the metal layer after the removal of the metal oxide layer to provide a more uniform thickness and a denser texture, and converting the metal barrier layer to a metal cap layer by introducing a silicon-containing gas onto a surface of the metal barrier layer.


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