The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2017

Filed:

Dec. 01, 2016
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Jean Coignus, Grenoble, FR;

Adam Dobri, Port Hope, CA;

Simon Jeannot, Grenoble, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/10 (2006.01); G11C 16/34 (2006.01); G11C 16/04 (2006.01); G11C 16/12 (2006.01);
U.S. Cl.
CPC ...
G11C 16/34 (2013.01); G11C 16/0408 (2013.01); G11C 16/12 (2013.01);
Abstract

A method for determining a leakage current through an inter-gate dielectric structure of a flash memory cell, the flash memory cell including a substrate including a channel region; a floating gate positioned above the channel region and separated from the channel region by a tunnel dielectric layer; a control gate positioned above the floating gate and separated from the floating gate electrode by the inter-gate dielectric structure; the method including programming the flash memory cell into an initial programmed state and applying biasing conditions to the programmed flash memory cell so as to obtain a zero electric field in the tunnel dielectric layer; measuring over time a change in a threshold voltage of the flash memory cell; and determining the leakage current from the change in the threshold voltage.


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