The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2017
Filed:
Jul. 09, 2014
European Aeronautic Defence and Space Company Eads France, Paris, FR;
Centre Nationale DE LA Recherche Scientifique, Paris, FR;
Ecole Normale Supérieure DE Cachan, Cachan, FR;
Caroline Petiot, Les Ulis, FR;
Stephane Roux, Rosny-Sous-Bois, FR;
Francois Hild, Chatenay Malabry, FR;
AIRBUS GROUP SAS, Blagnac, FR;
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, Paris, FR;
ECOLE NORMALE SUPERIEURE DE CACHAN, Cachan, FR;
Abstract
Disclosed is a method for measuring movement and/or deformation of a study part subjected to an external stress, the method implementing a color digital image acquisition device and image correlation unit. The method includes: acquisition () of a plurality of color digital images of the surface of the study part by way of the color digital image acquisition device during the application of an external stress on the study part, and processing () of the color digital images acquired in the step of acquisition of a plurality of color digital images so as to highlight contrasting details on variable scales.