The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2017

Filed:

Sep. 09, 2008
Applicants:

Yukio Sakagawa, Tokyo, JP;

Hiroshi Imamura, Tokyo, JP;

Akihiro Katayama, Yokohama, JP;

Hiroyuki Shinbata, Tama, JP;

Inventors:

Yukio Sakagawa, Tokyo, JP;

Hiroshi Imamura, Tokyo, JP;

Akihiro Katayama, Yokohama, JP;

Hiroyuki Shinbata, Tama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 50/22 (2012.01); A61B 6/00 (2006.01); G06F 19/00 (2011.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06F 19/345 (2013.01); A61B 6/00 (2013.01); G06F 19/321 (2013.01); G06F 19/3443 (2013.01); G06Q 50/22 (2013.01); G06T 7/0012 (2013.01); G06F 19/3431 (2013.01); G06T 2207/30004 (2013.01);
Abstract

A diagnosis support system which performs computer processing of data obtained from an object to be examined and presents the obtained diagnostic information is disclosed. The diagnosis support apparatus includes a diagnosis support processing unit which processes data obtained from the object to extract diagnosis support information, a storage unit which stores the examination history of the object, and a changing unit which changes a processing method in the diagnosis support processing unit in accordance with the examination history of the object stored in the storage unit. In at least one embodiment, diagnosis processing is executed to obtain medical diagnostic information by performing computer processing of data obtained from the object, and the processing method for diagnosis support processing is changed in accordance with the examination history of the object.


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