The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2017
Filed:
Jul. 23, 2014
Seema Chopra, Bangalore, IN;
David Purnell, Greenville, SC (US);
Shridhar Raghuvir Powar, Bangalore, IN;
John Robert Korsedal, Greenville, SC (US);
Christopher Farral, Greenville, SC (US);
Jenfu Yau, Greenville, SC (US);
Seema Chopra, Bangalore, IN;
David Purnell, Greenville, SC (US);
Shridhar Raghuvir Powar, Bangalore, IN;
John Robert Korsedal, Greenville, SC (US);
Christopher Farral, Greenville, SC (US);
Jenfu Yau, Greenville, SC (US);
General Electric Company, Schenectday, NY (US);
Abstract
Systems and methods for gas turbine operational impact modeling using statistical and physics-based methodologies are disclosed. According to one embodiment of the disclosure, a method can include receiving, by one or more processors, operational conditions data associated with a hardware component of a gas turbine; based at least in part on the operational variation data, applying, by one or more processors, statistical methods to establish an operational profile of the hardware component; receiving, by one or more processors, operating parameters and operational conditions data associated with the hardware component; based at least in part on the operating parameters and the operational conditions data, applying, by one or more processors, physics-based methods to establish an operational impact factor of the hardware component; and based at least in part on the operational profile and the operational impact factor determining, by one or more processors, a probability of a failure of the hardware component within a time period.