The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2017

Filed:

Jun. 24, 2015
Applicant:

Finisar Corporation, Sunnyvale, CA (US);

Inventors:

Henry Meyer Daghighian, Redwood City, CA (US);

Lucy G. Hosking, Santa Cruz, CA (US);

Gilles P. Denoyer, San Jose, CA (US);

Assignee:

Finisar Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 10/079 (2013.01); G06F 12/02 (2006.01); H04B 10/40 (2013.01); G06F 11/34 (2006.01); G06F 13/16 (2006.01);
U.S. Cl.
CPC ...
G06F 12/023 (2013.01); G06F 11/349 (2013.01); G06F 13/16 (2013.01); H04B 10/40 (2013.01); H04B 10/07953 (2013.01);
Abstract

Embodiments of a device and method to automatically acquire signal quality metrics in a digital communication system are disclosed. The device may include acquisition means to sample the likelihood of a digital communication signal passing through a grid of time and amplitude regions, and storage means by which such likelihood measurements may be accumulated in a computer memory array for analysis. A state machine may execute a method that controls both the acquisition means and the storage means, requiring minimal intervention from supervisory systems.


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