The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2017

Filed:

Dec. 22, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

James N. Klazynski, Austin, TX (US);

Amir Nahir, Megadin, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/22 (2006.01); G06F 11/263 (2006.01); G01R 31/317 (2006.01); G01R 31/3177 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2242 (2013.01); G01R 31/3177 (2013.01); G01R 31/31703 (2013.01); G01R 31/31705 (2013.01); G06F 11/2635 (2013.01);
Abstract

An approach for improving efficiency of cycle-reproducible debug in a multi-core environment is provided. The approach executes an exerciser image on one or more cores, wherein the exerciser image includes one or more different seeds. The approach determines a seed from the one or more different seeds that locates a fail-condition. Responsive to determining a seed from the one or more different seeds that locates the fail condition, the approach determines an upper bound and a lower bound of the fail-condition. The approach determines an exact cycle where the fail-condition occurs. The approach constructs a multi-cycle trace for the fail-condition.


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