The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2017

Filed:

Jan. 29, 2013
Applicant:

Olympus Corporation, Shibuya, Tokyo, JP;

Inventors:

Kenichi Kusaka, Tokyo, JP;

Atsushi Yonetani, Toyko, JP;

Masayoshi Karasawa, Kamiina, JP;

Katsuyuki Abe, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/04 (2006.01); G02B 21/00 (2006.01); G02B 21/16 (2006.01);
U.S. Cl.
CPC ...
G02B 21/04 (2013.01); G02B 21/0076 (2013.01); G02B 21/0088 (2013.01); G02B 21/16 (2013.01);
Abstract

In a microscope having a plurality of optical units each including a filter block between an objective and a tube lens, the optical unit closest to the objective among the plurality of optical units includes a first filter block provided with an optical filter having a first effective diameter. The optical unit closest to the tube lens among the plurality of optical units includes a second filter block provided with an optical filter having a second effective diameter larger than the first effective diameter.


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