The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2017
Filed:
Sep. 07, 2016
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Miesher L. Rodrigues, Buffalo Grove, IL (US);
Hao Yang, Redmond, WA (US);
Jimmy Wang, Lincolnshire, IL (US);
TOSHIBA MEDICAL SYSTMES CORPORATION, Otawara-shi, JP;
Abstract
A method and apparatus is provided to detect and correct for distributed X-ray detection events in which the electrical signal arising from the detection of an X-ray is distributed across more than one element of an X-ray detection array. Examples of distributed-detection events include charge sharing across adjacent boundaries between detector elements and X-ray fluorescence between detector elements. Distributed-detection events can be determined by their corresponding to a partial-detection energy that is in a range of energies great than an upper energy for noise and cross-talk and less than a lower energy for an X-ray spectrum from an X-ray source. For a distributed-detection event, the energy of the event is recorded using a sum of electrical signals from the detector elements of the event.