The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2017

Filed:

May. 03, 2013
Applicant:

The Regents of the University of Michigan, Ann Arbor, MI (US);

Inventors:

Thomas L. Chenevert, Ann Arbor, MI (US);

Brian D. Ross, Ann Arbor, MI (US);

Dariya I. Malyarenko, Ann Arbor, MI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/563 (2006.01); G01R 33/565 (2006.01); G01R 33/28 (2006.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56341 (2013.01); G01R 33/28 (2013.01); G01R 33/5602 (2013.01); G01R 33/56572 (2013.01);
Abstract

Techniques for correcting gradient non-linearity bias in mean diffusivity measurements by MRI systems are shown and include minimal number of spatial correction terms to achieve sufficient error control using three orthogonal diffusion weighted imaging (DWI) gradients. The correction is based on rotation of system gradient nonlinearity tensor into a DWI gradient frame where spatial bias of b-matrix is described by its Euclidian norm. The techniques obviate time consuming multi-direction acquisition and noise-sensitive mathematical diagonalization of a full diffusion tensor for medium of arbitrary anisotropy.


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