The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2017

Filed:

Jul. 22, 2014
Applicant:

Allegro Microsysterns, Llc, Worcester, MA (US);

Inventors:

P. Karl Scheller, Bow, NH (US);

James E. Burgess, Strafford, NH (US);

Steven E. Snyder, New Boston, NH (US);

Kristann L. Moody, Manchester, NH (US);

Devon Fernandez, Londonderry, NH (US);

Andrea Foletto, Annecy, FR;

Assignee:

Allegro MicroSystems, LLC, Worcester, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/00 (2006.01); G01P 3/487 (2006.01); G01P 3/488 (2006.01); G01P 21/02 (2006.01); G01R 23/00 (2006.01); G01P 3/44 (2006.01); G01P 13/00 (2006.01); G01R 33/06 (2006.01); G01D 5/244 (2006.01);
U.S. Cl.
CPC ...
G01R 33/0023 (2013.01); G01D 5/24476 (2013.01); G01P 3/44 (2013.01); G01P 3/487 (2013.01); G01P 3/488 (2013.01); G01P 13/00 (2013.01); G01P 21/02 (2013.01); G01R 23/005 (2013.01); G01R 33/06 (2013.01);
Abstract

Systems, methods and apparatuses for magnetic field sensors with self-test include a detection circuit to detect speed and direction of a target. One or more circuits to test accuracy of the detected speed and direction may be included. One or more circuits to test accuracy of an oscillator may also be included. One or more circuits to test the accuracy of an analog-to-digital converter may also be included. Additionally one or more IDDQ and/or built-in-self test (BEST) circuits may be included.


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