The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2017

Filed:

Aug. 28, 2013
Applicant:

Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;

Inventors:

Hiroaki Kojima, Tokyo, JP;

Koji Obata, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01); G01R 31/34 (2006.01); G01R 29/08 (2006.01); G01R 31/12 (2006.01); G01R 19/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/08 (2013.01); G01R 19/0053 (2013.01); G01R 29/0814 (2013.01); G01R 31/1263 (2013.01); G01R 31/346 (2013.01);
Abstract

The present invention provides a partial-discharge measurement method in which a partial-discharge defect signal and noise are separated, a partial-discharge defect position is detected, and the risk of a detected partial discharge defect is diagnosed. Further, this method provides a highly reliable high-voltage device. An electromagnetic wave generated by a sample is simultaneously measured by a plurality of sensors. A partial discharge and noise are separated through the comparison of the spatial intensity distribution of measured signals and a spatial signal intensity distribution measured beforehand at the time of the occurrence of a partial discharge, and a defect position is detected using a peak position. Further, the risk of a defective site is diagnosed on the basis of a simultaneously measured charge amount signal.


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