The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2017
Filed:
Nov. 02, 2012
Applicant:
Sumitomo Rubber Industries, Ltd., Kobe-shi, Hyogo, JP;
Inventors:
Fusae Kaneko, Kobe, JP;
Hiroyuki Kishimoto, Kobe, JP;
Assignee:
SUMITOMO RUBBER INDUSTRIES, LTD., Kobe-Shi, Hyogo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/44 (2006.01); G01N 23/06 (2006.01); G01N 23/22 (2006.01); G01N 23/227 (2006.01); G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
G01N 33/445 (2013.01); G01N 23/063 (2013.01); G01N 23/2206 (2013.01); G01N 23/2273 (2013.01); G01N 2223/041 (2013.01); G01N 2223/071 (2013.01); G01N 2223/085 (2013.01); G01N 2223/203 (2013.01); G01N 2223/623 (2013.01); G01N 2223/627 (2013.01); G01N 2223/632 (2013.01); G06F 19/70 (2013.01);
Abstract
The present invention provides a method of deterioration analysis that enables detailed analysis of the deterioration, especially of the surface, of a polymer material containing at least two diene polymers. The present invention relates to a method of deterioration analysis including: irradiating a polymer material containing at least two diene polymers with high intensity x-rays; and measuring x-ray absorption while varying the energy of the x-rays, to analyze the deterioration of each diene polymer.