The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2017
Filed:
Jan. 11, 2013
Nec Corporation, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
Disclosed is a structure analyzing device and a structure analyzing method which can analyze a state change of a structure, which is caused before the structure is destroyed, such as a state change of degradation of the structure or the like. A structure analyzing device () includes a vibration detecting unit () which detects a vibration of a structure, and an analysis unit () which analyzes an output signal of the vibration detecting unit (). The analysis unit () analyzes a state change of the structure by comparing a value of resonant sharpness Q, which is measured by use of the following formula (1) in a state existing when carrying out analysis, with a value of resonant sharpness Q which is measured by use of the following formula (1) in a standard state.