The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2017

Filed:

Aug. 24, 2016
Applicant:

Honda Motor Co., Ltd., Minato-ku, Tokyo, JP;

Inventors:

Takanori Maebashi, Wako, JP;

Yoshiya Fujiwara, Wako, JP;

Mitsumoto Kawai, Wako, JP;

Nariaki Kuriyama, Wako, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/20 (2006.01); G01N 27/416 (2006.01); H01M 14/00 (2006.01); H01J 37/16 (2006.01); H01M 10/42 (2006.01); H01J 37/26 (2006.01);
U.S. Cl.
CPC ...
G01N 27/4168 (2013.01); H01J 37/16 (2013.01); H01J 37/20 (2013.01); H01M 10/4285 (2013.01); H01M 14/00 (2013.01); H01J 37/26 (2013.01);
Abstract

Substrates forming an overlapping portion of an analytical cell have through holes each having a shape tapered from an outer surface of the substrate facing to outside of the overlapping portion toward an inner surface thereof facing to inside thereof. An observation window is formed between the through holes facing each other. In the overlapping portion, at least one of negative and positive electrode active materials is provided between transmission membranes of the observation window, and at least one pillar is provided between first and second positions. At the first position, edge portions of the through holes of the outer surfaces are face-to-face with each other. At the second position, edge portions of the through holes of the inner surfaces are face-to-face with each other. At least one spacer is further provided at a position shifted from the first position toward a circumferential edge of the overlapping portion.


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