The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2017

Filed:

Apr. 26, 2016
Applicant:

Fuji Xerox Co., Ltd., Tokyo, JP;

Inventors:

Kazutaka Takeda, Ebina, JP;

Kazuyuki Matsushita, Ebina, JP;

Kohei Yukawa, Ebina, JP;

Hideaki Ozawa, Ebina, JP;

Taku Kinoshita, Ebina, JP;

Hideo Nakayama, Ebina, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/21 (2006.01); G01N 21/31 (2006.01); G01N 33/49 (2006.01);
U.S. Cl.
CPC ...
G01N 21/21 (2013.01); G01N 21/31 (2013.01); G01N 33/492 (2013.01); G01N 2021/3129 (2013.01);
Abstract

A concentration calculation system calculates a concentration of the optically active substance based on a formula. The formula includes a first function representing wavelength dependence of an optical rotation of a first optically-active substance, and a second function representing wavelength dependence of an optical rotation of a second optically-active substance. In the first function, concentration of the first optically-active substance has an unknown value, and an inherent value for defining a characteristic of optical rotatory dispersion of the first optically-active substance is a known value or an unknown value within a certain limited range. In the second function, an inherent value for defining a characteristic of optical rotatory dispersion of the second optically-active substance is an unknown value. The concentration of the first optically-active substance is calculated based on the formula and optical rotations of measurement target respectively corresponding to a plurality of wavelengths, by using a least-squares method.


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