The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2017

Filed:

Dec. 15, 2014
Applicant:

Azbil Corporation, Tokyo, JP;

Inventor:

Seiichiro Kinugasa, Tokyo, JP;

Assignee:

Azbil Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1434 (2013.01); G01N 2015/149 (2013.01); G01N 2015/1486 (2013.01);
Abstract

A particle detecting device includes: a light source that illuminates, with an excitation beam, a fluid that contains a plurality of particles; a fluorescence measuring instrument that measures fluorescence that is produced in a region that is illuminated by the excitation beam; a scattered light measuring instrument that measures scattered light that is produced in a region that is illuminated by the excitation beam; an interference status evaluating portion that evaluates whether the scattered light that is measured is producing constructive interference or producing destructive interference; and a particle counting portion that counts a plurality of particles depending on the measured interference of the measured light.


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