The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2017

Filed:

Jun. 26, 2015
Applicant:

Real Science Innovations, Llc, Lander, WY (US);

Inventors:

Lauren Heerschap, Lander, WY (US);

David Heerschap, Lander, WY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 17/16 (2006.01);
U.S. Cl.
CPC ...
G01C 17/16 (2013.01);
Abstract

An apparatus and methodology for measuring strike and dip of a plane, trend and plunge of a line, directional bearing in the horizontal plane, and angle of inclination in the vertical plane. More specifically, the present invention relates to a compass adapted to measure geological features using single compass configurations for each type of measurement. The compass includes a base, a hinge assembly rotatably interconnected to the base, and a lid rotatably interconnected to the hinge assembly. The lid is operable to rotate around both a major axis and a minor axis of the compass. A sight tube is positioned in a hollow bore of the hinge assembly and is operable to sight directional bearings.


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