The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2017
Filed:
Mar. 09, 2011
Michael A. Davis, Glastonbury, CT (US);
Mark A. Foss, Glastonbury, CT (US);
Michael A. Davis, Glastonbury, CT (US);
Mark A. Foss, Glastonbury, CT (US);
CiDRA CORPORATE SERVICES, INC., Wallingford, CT (US);
Abstract
New techniques are provided for measuring the thickness of a pipe wall using ultrasonic reflections. The apparatus includes a signal processor that receives a signal containing information about ultrasonic pulses injected into a pipe wall; and determines a pipe wall thickness measurement based at least partly on decomposing the signal received in order to identify either peaks using a cepstrum analysis or repeated spacing using a wavelet analysis. The wavelet analysis includes dividing data in the signal received into a specific frequency component and a defined temporal component in order to detect correct pulses where multiple reflections are caused by irregularities in the pipe wall surface being measured. The cepstrum analysis includes processing repeating pulses in the signal in order to detect correct pulses where multiple reflections are caused by irregularities in the pipe wall surface being measured.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile