The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2017

Filed:

Mar. 21, 2013
Applicant:

Advanced Micro-fabrication Equipment Inc, Shanghai, Shanghai, CN;

Inventors:

Baoxia Tian, Shanghai, CN;

Steven Tianxiao Lee, Shanghai, CN;

Yingbin Liu, Shanghai, CN;

Quanyong Guo, Shanghai, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H05B 1/02 (2006.01); F27D 19/00 (2006.01); C23C 16/46 (2006.01); C23C 16/52 (2006.01); F27D 21/00 (2006.01); F27D 21/04 (2006.01);
U.S. Cl.
CPC ...
F27D 19/00 (2013.01); C23C 16/46 (2013.01); C23C 16/52 (2013.01); F27D 21/0014 (2013.01); F27D 21/04 (2013.01); F27D 2019/0025 (2013.01);
Abstract

Provided are an apparatus and a method for controlling the heating of the base within a chemical vapour deposition chamber, which apparatus is applicable to an MOCVD reaction chamber. The apparatus comprises a heater located within a chamber; a tray located near the heater within the chamber and spaced apart from the heater and used for carrying the base; a first temperature control unit coupled with a surface of the tray for carrying the base and used for measuring the temperature of the tray surface and outputting a first control signal as a function of a set temperature and the temperature of the tray surface; and a second temperature control unit connected to the first temperature control unit and used for measuring the temperature of the middle of the area between the tray and the heater, and also for outputting a second control signal as a function of the first control signal and the temperature of the middle, with the heater being coupled with the second temperature control unit to heat according to the second control signal. Further provided is a method for controlling the heating of the base within a chemical vapour deposition chamber. A steady base temperature can be obtained via the apparatus.


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