The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2017

Filed:

Nov. 20, 2015
Applicant:

Echopixel, Inc., Los Altos Hills, CA (US);

Inventor:

Sergio Aguirre-Valencia, Santa Clara, CA (US);

Assignee:

Echo Pixel, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2011.01); H04N 13/04 (2006.01); H04N 13/00 (2006.01); H04N 13/02 (2006.01); G06T 3/40 (2006.01); G06T 15/20 (2011.01);
U.S. Cl.
CPC ...
H04N 13/0484 (2013.01); G06T 3/40 (2013.01); G06T 15/20 (2013.01); H04N 13/0022 (2013.01); H04N 13/0278 (2013.01); G06T 2200/04 (2013.01); H04N 2213/006 (2013.01);
Abstract

A computer system that provides stereoscopic images is described. During operation, the computer system generates the stereoscopic images at a location corresponding to a viewing plane based on data having a discrete spatial resolution, where the stereoscopic images include image parallax. Then, the computer system scales objects depicted in the stereoscopic images so that depth acuity associated with the image parallax is increased, where the scaling is based on the spatial resolution and a viewing geometry associated with a display. For example, the viewing geometry may include a distance from an individual that views the stereoscopic images on the display and the display. Alternatively, the viewing geometry may include a focal point of the individual. Next, the computer system provides the resulting stereoscopic images to the display. In this way, the computer system may optimize the depth acuity for data having discrete sampling.


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