The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2017
Filed:
Oct. 03, 2016
Applicant:
Pfu Limited, Kahoku-shi, Ishikawa, JP;
Inventor:
Tomoaki Wada, Ishikawa, JP;
Assignee:
PFU LIMITED, Ishikawa, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01); H04N 1/387 (2006.01); G06T 3/60 (2006.01);
U.S. Cl.
CPC ...
H04N 1/3878 (2013.01); G06T 3/608 (2013.01); H04N 1/00718 (2013.01); H04N 1/00737 (2013.01); H04N 1/00748 (2013.01); H04N 1/00763 (2013.01); H04N 1/00774 (2013.01); H04N 2201/0081 (2013.01);
Abstract
According to the present disclosure, edges of a document image contained in a read image read by an image-reading apparatus including a paper path are detected, a candidate edge-skew occurrence position is detected, a candidate content-skew occurrence position is detected, an accumulated-skew occurrence position is detected based on the candidate edge-skew occurrence position and the candidate content-skew occurrence position, skew of a document rear-part image rearward from the accumulated-skew occurrence position in the conveyance direction is corrected, and image data corrected for accumulated skew is acquired.