The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2017

Filed:

May. 11, 2015
Applicant:

Interchip Corporation, Shiroi-shi, JP;

Inventors:

Masaaki Kamiya, Shiroi, JP;

Ryuji Ariyoshi, Shiroi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/93 (2006.01); H01L 27/08 (2006.01); H03B 5/36 (2006.01); H03H 11/04 (2006.01);
U.S. Cl.
CPC ...
H01L 29/93 (2013.01); H01L 27/0808 (2013.01); H03B 5/366 (2013.01); H03H 11/04 (2013.01); H03B 2201/0208 (2013.01);
Abstract

Each of varicapsA toC configured to be connected in parallel is an MOS capacitor III produced under a common and single process condition. Each of the varicapsA toC has a conductor layer serving as a second electrode and formed via a capacitance insulating film on a first conductivity-type semiconductor substrate serving as a first electrode, and a second conductivity-type impurity region formed near a surface in proximity to a region of the first conductivity-type semiconductor substrate opposing the conductor layer. Each of the varicapsA toC is configured such that a capacitance value as a capacitance element between the first conductivity-type semiconductor substrate serving as the first electrode and the conductor layer serving as the second electrode is changed by applying a control voltage to the conductor layer while applying any one of a plurality of types of direct-current voltages having different voltages to the second conductivity-type impurity region.


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