The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2017
Filed:
Aug. 15, 2016
Canon U.s.a. Inc., Melville, NY (US);
Zhuo Wang, Middleton, MA (US);
CANON U.S.A., INC., Melville, NY (US);
Abstract
An image processing method. At least one light ray presented by a vector in a first affine coordinate system with a tip of the probe as an origin is projected from the tip of the probe. The light ray is intercepted from a projection surface satisfying a function in the first affine coordinate. A distance between the tip of the probe and an interception point of the light ray on the projection surface is obtained based on a rotation angle of the probe, a wavelength of the light ray, and a deflection angle of the light ray from the probe. A relationship between the first coordinate and a second affine coordinate system defined with the projection surface as a reference is obtained. Image data are acquired from the light ray reflected from the target surface presented in the first affine coordinate. The image data presented in the first affine coordinate are converted into image data presented in the second affine coordinate, and the image data in the second coordinate system are resampled by interpolating or extrapolating a gray scale.