The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2017

Filed:

Apr. 19, 2012
Applicants:

Yekesa Kosuru, Westford, MA (US);

Alexey Yakubovich, Buffalo Grove, IL (US);

Senthil Natesan, Bartlett, IL (US);

Boris Lublinsky, Naperville, IL (US);

Inventors:

Yekesa Kosuru, Westford, MA (US);

Alexey Yakubovich, Buffalo Grove, IL (US);

Senthil Natesan, Bartlett, IL (US);

Rajiv Synghal, Concord, CA (US);

Boris Lublinsky, Naperville, IL (US);

Assignee:

HERE Global B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G01C 21/20 (2006.01); G06Q 30/02 (2012.01); G06F 3/01 (2006.01); G01C 21/32 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30595 (2013.01); G01C 21/32 (2013.01);
Abstract

An approach is provided for providing a unified extensible platform for overall probe data and storage. The approach comprises causing, at least in part, a storage of probe data in one or more information spaces, one or more namespaces of the one or more information spaces, or a combination thereof. The approach further comprises determining one or more nodes for processing the probe data based, at least in part, on one or more context criteria, the one or more nodes associated with the one or more information spaces. The approach also comprises determining to provide access to the processed probe data via the one or more information spaces, the one or more namespaces, or a combination thereof.


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