The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2017

Filed:

Oct. 06, 2015
Applicant:

Ca, Inc., New York, NY (US);

Inventors:

Saugata Chakraborty, Bengaluru, IN;

Sudip Mitra, Karnataka, IN;

Swapnel Shrivastava, Karnataka, IN;

Assignee:

CA, Inc., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3688 (2013.01);
Abstract

A multi-staged method is disclosed in which a computing device generates tests to execute on an application program. The tests that are generated do not supplant or replace other types of testing typically executed on an application program, but rather, are generated based on the results of those tests and are intended to complement those tests. The multi-stage method particularly captures and stores information related to the tests as those tests are executed on the application program, verifies the data and parameters associated with the tests, and then generates a set of supplementary tests to test the application program responsive to receiving a notification message indicating that the program code of the application program has been changed.


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