The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2017

Filed:

Jun. 19, 2014
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

Xugang Shen, Beijing, CN;

Qingsheng Zhang, Beijing, CN;

Yongshun Jin, Beijing, CN;

Assignee:

ORACLE INTERNATIONAL CORPORATION, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 12/14 (2006.01); G06F 17/00 (2006.01); G06F 7/00 (2006.01); G06F 9/52 (2006.01); G06F 11/07 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 9/52 (2013.01); G06F 9/526 (2013.01); G06F 11/073 (2013.01); G06F 11/0784 (2013.01); G06F 11/0793 (2013.01); G06F 11/34 (2013.01);
Abstract

A system and method can support an adaptive self-tuning locking mechanism in a transactional middleware machine environment. The system allows each process in a plurality of processes to perform one or more test-and-set (TAS) operations in order to obtain a lock for data in a shared memory. Then, the system can obtain a spin failed rate for a current tuning period, wherein a spin failure happens when a process fails to obtain the lock after performing a maximum number of rounds of TAS operations that are allowed. Furthermore, the system can adaptively configuring a spin count for a next tuning period based on the obtained spin failure rate, wherein the spin count specifies the maximum number of rounds of TAS operations that are allowed for the next tuning period.


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