The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2017
Filed:
Feb. 27, 2014
Sharp Kabushiki Kaisha, Osaka-shi, Osaka, JP;
Yuhji Yashiro, Osaka, JP;
Kazuya Yoshimura, Osaka, JP;
Shogo Hayashi, Osaka, JP;
Kazutoshi Kida, Osaka, JP;
Shinji Matsumoto, Osaka, JP;
Takenori Maruyama, Osaka, JP;
Tsuyoshi Ohmori, Osaka, JP;
Akira Yasuta, Osaka, JP;
SHARP KABUSHIKI KAISHA, Sakai, JP;
Abstract
Provided is a method for inspecting a touch panel with which method it is possible to perform an inspection with high accuracy and to allow an improvement in yield. A drive signal is supplied to either one of sensor electrodes () and an inspection electrode (), a plurality of sense signals related to the respective sensor electrodes () are obtained from the other of the sensor electrodes and the inspection electrode, and conditions of the sensor electrodes () are determined according to the sense signals.