The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2017
Filed:
Jan. 21, 2016
University of North Dakota, Grand Forks, ND (US);
Jeremy Straub, Grand Forks, ND (US);
Benjamin Kading, Park Rapids, MN (US);
Scott Kerlin, Grand Forks, ND (US);
University of North Dakota, Grand Forks, ND (US);
Abstract
The systems and methods described herein include an approach to performing quality assessment for 3-D printed objects during the printing process, for collecting data regarding 3-D printed objects, and for capturing data to make a digital model of an object. This approach uses sensor data (e.g., digital imagery) to characterize printing progress or to detect 3-D printing defects that would otherwise result in printing incomplete objects, such as premature printing job termination, dry printing, over/under application, movement of the filament, and other defects. Sensor data capturing can also be used as part of a destructive scanning process to perform post-printing object assessment or to collect data on a real-world object to facilitate creation of a digital model. These systems and methods may leverage the discrete nature of a pixel provided through digital imagery to be assessed with limited computational resources in a non-recursive manner.