The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2017
Filed:
Mar. 11, 2015
National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);
Armin W. Doerry, Albuquerque, NM (US);
Douglas L. Bickel, Albuquerque, NM (US);
Richard M. Naething, Albuquerque, NM (US);
Volker Horndt, San Diego, CA (US);
National Technologies & Engineering Solutions of Sandia, LLC, Albuquerque, NM (US);
Abstract
The various technologies presented herein relate to utilizing direction of arrival (DOA) data to determine various flight parameters for an aircraft A plurality of radar images (e.g., SAR images) can be analyzed to identify a plurality of pixels in the radar images relating to one or more ground targets. In an embodiment, the plurality of pixels can be selected based upon the pixels exceeding a SNR threshold. The DOA data in conjunction with a measurable Doppler frequency for each pixel can be obtained. Multi-aperture technology enables derivation of an independent measure of DOA to each pixel based on interferometric analysis. This independent measure of DOA enables decoupling of the aircraft velocity from the DOA in a range-Doppler map, thereby enabling determination of a radar velocity. The determined aircraft velocity can be utilized to update an onboard INS, and to keep it aligned, without the need for additional velocity-measuring instrumentation.