The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2017

Filed:

Jan. 05, 2015
Applicant:

Osteotronix Medical Pte Limited, Marina Bay, SG;

Inventors:

Timothy W. James, Santa Barbara, CA (US);

Lance W. Farr, Swansea, GB;

James Rafferty, Godrergraig, GB;

David Chase, Santa Barbara, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/48 (2006.01); G01R 33/483 (2006.01); G01R 33/565 (2006.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
G01R 33/4818 (2013.01); G01R 33/4833 (2013.01); G01R 33/5659 (2013.01); G01R 33/5616 (2013.01); G01R 33/5617 (2013.01);
Abstract

In a structural analysis using NMR techniques, a method for gathering k-value data from frequency encoded spin echoes generated from internal volumes selectively excited by intersecting 90° and 180° slice selective and refocusing RF pulses and subjected to a read gradient for the purpose of quantifying the spatial frequency content of the selected internal volume without contamination by a FID signal, comprising: acquiring spin echo data such that the FID signal generated by imperfections in the 180° slice selective refocusing RF pulse is attenuated by the read gradient such that any remaining FID signal is spatially encoded with higher k-values than the frequency encoded k-values being recorded for subsequent structural analysis while simultaneously providing for t2 t2* and t1 contrast. Other aspects of the invention are disclosed.


Find Patent Forward Citations

Loading…