The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2017
Filed:
Sep. 16, 2016
Glasstech, Inc., Perrysburg, OH (US);
Jason C. Addington, Sylvania, OH (US);
Michael J. Vild, Toledo, OH (US);
Benjamin L. Moran, Perrysburg, OH (US);
Glasstech, Inc., Perrysburg, OH (US);
Abstract
A method for measuring optical distortion in a contoured glass sheet includes the steps of conveying the glass sheet in a first direction, employing at least one display to project a preselected multi-phase non-repeating contrasting pattern, and employing at least one camera, and uniquely pairing each one of the cameras one of the displays. The method may also include controlling each of the cameras to acquire the desired images, analyzing and combining the data acquired by the cameras to construct a definition of the surface of the glass sheet, and performing one or more optical processing operations on the surface data to analyze the optical characteristics of the glass sheet.