The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2017
Filed:
Mar. 27, 2015
Canon Kabushiki Kaisha, Tokyo, JP;
Hiroyuki Kubo, Ikoma, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A versatile method(s) capable of reducing the time required for measurement of reflection characteristics and the amount of data indicating measurement results is (are) provided herein. An information processing apparatus may determine a measurement condition to measure reflection characteristics of an object which is to be used to generate a virtual image that can be obtained when a virtual object is observed from a predetermined virtual viewpoint in a virtual space where a virtual light source and virtual object are disposed. The information processing apparatus may include a path acquisition unit configured to acquire a path of light along which light emitted from the virtual light source reaches the virtual viewpoint after being reflected on the virtual object, and a determination unit configured to determine a measurement condition of the reflection characteristics corresponding to the path of light based on the path of light acquired by the path acquisition unit.