The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2017
Filed:
Oct. 17, 2011
Henrik Vilstrup Juhl, Roskilde, DK;
Henrik Vilstrup Juhl, Roskilde, DK;
FOSS ANALYTICAL A/S, Hilleroed, DK;
Abstract
Compensating for frequency drift of a reference energy source in an FT interferometer based spectrometer instrument may include obtaining data representing a reference interferogram collected in response to a trigger signal having been generated in dependence on the emission frequency of the reference energy source, and subsequently obtaining data representing a target interferogram recorded by the FT interferometer in response to a trigger signal also having been generated in dependence on the emission frequency of the reference energy source in the same manner. The method may further include comparing the obtained data to determine a phase shift between the interferograms in a window in at least one region away from center-burst, and generating a mathematical transform dependent on the determined shift to be subsequently applied to generate data representing a frequency stabilized interferogram of an unknown sample recorded by the FT interferometer.