The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2017
Filed:
Sep. 25, 2015
Applicant:
Dieterich Standard, Inc., Boulder, CO (US);
Inventors:
Nathaniel Kirk Kenyon, Boulder, CO (US);
Bryce Arthur Bingham, Boulder, CO (US);
John Henry Stehle, Boulder, CO (US);
Assignee:
Dieterich Standard, Inc., Boulder, CO (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/25 (2006.01);
U.S. Cl.
CPC ...
G01B 5/25 (2013.01);
Abstract
An alignment device for a wafer in an industrial process assembly includes an inner surface shaped to conform to an outer surface of a wafer, an outer surface comprising at least two cams; and two ends connecting the inner surface to the outer surface. The two ends are positioned such that when the alignment device is positioned on the outer surface of the wafer, the alignment device extends more than one hundred eighty degrees around the wafer.